C8051F930-TB

C8051F930-GDI Tested Single/Dual Battery, 0.93.6 V, 64 kB Flash, SmaRTClock, 10-Bit ADC MCU Die in Wafer Form Supply Voltage 0.9 to 3.6 V Memory - One-Cell Mode supports 0.9 to 1.8 V operation - 4352 bytes internal data RAM (256+4096) - Two-Cell Mode supports 1.8 to 3.6 V operation - 64 kB Flash In-system programmable in 1024-byte - Built-in dc-dc converter with 1.8 to 3.3 V output for sectors--1024 bytes are reserved in the 64 kB use in one-cell mode devices - Built-in LDO regulator allows a high analog supply Digital Peripherals voltage and low digital core voltage - 24 port I/O All 5 V tolerant with high sink current - 2 built-in supply monitors (brownout detectors) and programmable drive strength 10-Bit Analog to Digital Converter TM 2 TM - 1LSB INL no missing codes - Hardware SMBus (I C Compatible), 2 x SPI , - Programmable throughput up to 300 ksps and UART serial ports available concurrently - 23 external inputs - Four general purpose 16-bit counter/timer array with - On-Chip Voltage Reference six capture/compare modules and watchdog timer - On-Chip PGA allows measuring voltages up to twice - Hardware SmaRTClock operates down to 0.9V and the reference voltage requires less than 0.5 A supply current - 16-bit Auto-Averaging Accumulator with Burst Mode Clock Sources provides increased ADC resolution - Internal oscillators: 24.5 MHz, 2% accuracy sup- - Data dependent windowed interrupt generator ports UART operation 20 MHz low power oscillator - Built-in temperature sensor requires very little bias current Two Comparators - Programmable hysteresis and response time - External oscillator: Crystal, RC, C, or CMOS Clock - Configurable as wake-up or reset source - SmaRT Clock oscillator: 32 kHz Crystal or internal - 23 Capacitive Touch Sense inputs self-oscillate mode 6-Bit Programmable Current Reference - Can switch between clock sources on-the-fly useful - Up to 500 A. Can be used as a bias or for gener- in implementing various power saving modes ating a custom reference voltage o Temperature range: 40 to +85 C On-Chip Debug - On-chip debug circuitry facilitates full-speed, non- Full Technical Data Sheet intrusive in-system debug (no emulator required) - C8051F93x-C8051F92x - Provides breakpoints, single stepping - Inspect/modify memory and registers - Complete development kit High-Speed 8051 C Core - Pipelined instruction architecture executes 70% of instructions in 1 to 2 system clocks - 25 MIPS throughput with 25 MHz clock - Expanded interrupt handler ANALOG DIGITAL I/O UART PERIPHERALS Port 0 SMBus 2 x SPI A 10-bit IREF M PCA 300 ksps Port 1 U Timer 0 ADC X Timer 1 + + Timer 2 VREF Port 2 TEMP Timer 3 SENSOR VREG VOLTAGE CRC COMPARATORS 24.5 MHz PRECISION 20 MHz LOW POWER INTERNAL OSCILLATOR INTERNAL OSCILLATOR External Oscillator HARDWARE SmaRTClock HIGH-SPEED CONTROLLER CORE 64 kB 8051 CPU 4352 B ISP FLASH (25 MIPS) SRAM FLEXIBLE DEBUG POR WDT INTERRUPTS CIRCUITRY Rev. 1.3 11/13 Copyright 2013 by Silicon Laboratories C8051F930-GDI EMIF CROSSBARC8051F930-GDI 1. Ordering Information Table 1.1. Product Selection Guide C8051F930-G-G1DI 25 64 4352 1 124 24 2 28.54 mil / 725 m (no back- grind) C8051F930-G-GDI 25 64 4352 1 124 24 2 12 mil (backgrind) *Note: 1024 bytes reserved for factory use. 2 Rev. 1.3 Ordering Part Number MIPS (Peak) Flash Memory (kB) RAM (Bytes) SmaRTClock Real Time Clock 2 SMBus/I C UART Enhanced SPI Timers (16-bit) Programmable Counter Array Digital Port I/Os 10-bit 300ksps ADC Programmable Current Reference Internal Voltage Reference Temperature Sensor Analog Comparators Lead-free (RoHS Compliant) Wafer Thickness